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Comparative study of the compatibility of aliphatic polyketone tercopolymer blends using a technique combining scanning electron microscopy and energy-dispersive X-ray spectroscopy

Lee S

2026

Abstract

Abstract The compatibility of polyketone (PK)/polyamide6 (PA) and PK/styrene-acrylonitrile (SAN) polymer blends was compared through elemental analysis combining scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS). Elemental mapping technology reveals sea and island-like phase separation patterns more clearly than SEM observations, as well as the continuous domain-in-domain form of PK/SAN and the layered structure of PK/SAN/additive mixtures. The SEM/EDS elemental mapping results for the PK/PA mixture showed no overall phase separation; instead, nanoscale separation structures similar to those observed by transmission electron microscopy (TEM) were clearly visible, proving that this is a useful method for evaluating the compatibility of polymer blends. Elemental line scan results for the PK/SAN blend showed a significant gradient in the intensity of oxygen and nitrogen elements across the interface, indicating a large compositional difference between the two phases and a lack of compatibility. The interfacial thickness of the PK/SAN blend, estimated using the compositional gradient observed in the line scan, was approximately 0.17–0.51 µm. It was found that the interface thickness of the PK70/PA30 blend was ranged 0.3 to 0.7 µm, that of the PK30/PA70 blend showed no significant compositional differences in nitrogen and oxygen pulse intensities across the interface, suggesting active interdiffusion, adhesion, and a thich interface and that the…

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