Signature Analysis applied to EDS microanalysis
Abstract
Abstract Most spectroscopies (FTIR, XRD, RAMAN, MS, etc.), were developed in order to identify materials. This is accomplished by capturing the spectral “signature” of an unknown and matching it to those of a comprehensive database of reference materials. Development of these spectroscopies has included efforts to embellish the associated database. EDS evolved as a resource to provide qual/quant, and development has been to improve the accuracy of quantation. Until recently, EDS was not considered a spectroscopy to provide identification of materials.
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