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Jeol JSM-7800F EDS/ebsd

JEOL

The University of Queensland, 2025

Abstract

General descriptionThe 7800 is a type of microscope called a Field Emission Scanning Electron Microscope (FE-SEM), which uses a special electron gun to shoot electrons at a sample. These electrons interact with the sample in different ways, either bouncing back to a detector or causing the sample to release more electrons. This helps gather information about the sample's composition or its structure. The microscope has additional detectors to analyze the sample's elemental composition (EDS), crystal structure (EBSD), and another in lens detector to achieve resolutions down to ~1 nanometers.Hardware specificationsinstallation of instrument: 2012Resolution:- 0.8 nm(15 kV)- 1.2 nm(1 kV)- 3.0 nm (15kV、5nA、WD10mm)Accelerting Voltage: - 0.1kV to 30kVDetectors:- Upper Electron Detector- Secondary Electron Detector- Backscatter Detector - Oxford EDS- Oxford HKL EBSDSoftware specificationsJEOL PC-SEM Ver5.1.0.15, Oxford Aztec version 5.0Supporting equipmentJEOL PC-SEM for microscope control, with Oxford Instruments AZtec EDS and EBSD acquisition and analysis software.FunctionsHigh-resolution SEM imaging, automated EDS and EBSD mapping, crystallographic orientation, and phase analysis.Ultra-short version (for forms)JEOL PC-SEM + Oxford AZtec (EBSD)Supporting equipmentOxford Instruments EBSD detector and EDS detectorAccess rightsAll users need to complete a Project Application, providing details of project, Chief Investigator, chart string, and projects goals. All projects require an…

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