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In situ transmission electron microscopy characterization of MXene interfaces: a review

Wang W, Cao N

RSC advances, 2026

Abstract

As an emerging class of two-dimensional layered transition metal carbides, nitrides and carbonitrides, MXenes show enormous application potential in energy storage and conversion, catalysis, sensing, and electromagnetic shielding, owing to their excellent electrical conductivity, tunable surface chemistry, unique interlayer structure, and good mechanical performance. The intrinsic interfaces (such as surface functional groups, defects, and interlayers) and heterojunction interfaces formed by compounding with polymers, metals, semiconductors, etc., are central to regulating their macroscopic properties. The microstructure of these interfaces (atomic arrangement, chemical bonding, element distribution, dynamic evolution) directly determines MXenes' electron/ion transport efficiency, catalytic activity, structural stability, and functional synergy in practical applications. Transmission electron microscopy (TEM) has become an indispensable tool for studying MXene interfaces, featuring atomic-level spatial resolution, excellent elemental and chemical state analysis, and reliable in situ dynamic characterization capabilities that can simulate actual working environments such as high temperature and electrochemical reaction conditions. Specifically, HRTEM and Cs-corrected STEM (especially HAADF-STEM) visualize atomic structures, surface terminations, and defects at the atomic scale with high clarity; EELS and EDS allow accurate qualitative-quantitative analysis of interfacial…

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