Bone Mineral Density Screening System Using CMOS-Sensor X-ray Detector
Abstract
This research concerns a design and construction of a bone mineral density (BMD) and bone mineral content (BMC) measurement system based on dual energy X-ray absorptiometry (DEXA). An indirect X-ray detector is designed by optical coupling CMOS sensor with image on the intensifying screen. A dedicated microcontroller X-ray apparatus is used as an X-ray source to capture two energy level X-ray of middle phalanges bone of middle finger. The captured image is processed based on modified Beer-Lambert law to compute bone mineral density. Bone mineral content is also computed by determining the area of the phalanges bone using active contour. The designed bone mineral density (BMD) and bone mineral content (BMC) measurement system is low-cost and hence can be distributed at district hospital for screening purposes of Osteoporosis of the elderly. Compared with BMD measured from commercial model, BMD measurement of our system acquires linear relation with R2 equals 0.969. The mean square error between the normalized BMD value and that of the commercial model is 0.0000981.
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