Flux maximization techniques for compton backscatter depth profilometry
Abstract
Resolution in x-ray backscatter imaging has often been hampered by low fluxes. But, for a given set of resolution requirements and geometric constraints, it is possible to define a maximization problem in the geometric parameters for which the solution is the maximum flux possible in those circumstances. In this way, resolution in noncritical directions can be traded for improved resolution in a desired direction. Making this the thickness, or surface normal direction, makes practicable the depth profiling of layered structures. Such techniques were applied to the problem of imaging the layered structure of corroding aircraft sheet metal joints using Compton backscatter.
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