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Analysis of a proposed Compton backscatter imaging technique

James M. Hall, Barry A. Jacoby

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE, 1994

Abstract

One-sided imaging techniques are currently being used in nondestructive evaluation of surfaces and shallow subsurface structures. In this work we present both analytical calculations and detailed Monte Carlo simulations aimed at assessing the capability of a proposed Compton backscattering imaging technique designed to detect and characterize voids located several centimeters below the surface of a solid.

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