High-Energy X-Ray Diffraction Microscopy in Materials Science
Abstract
High-energy diffraction microscopy (HEDM) is an implementation of three-dimensional X-ray diffraction microscopy. HEDM yields maps of internal crystal orientation fields, strain states, grain shapes and locations as well as intragranular orientation distributions, and grain boundary character. Because it is nondestructive in hard materials, notably metals and ceramics, HEDM has been used to study responses of these materials to external fields including high temperature and mechanical loading. Currently available sources and detectors lead to a spatial resolution of ∼1 μm and an orientation resolution of <0.1 ○ . With the penetration characteristic of high energies ( E ≥ 50 keV), sample cross-section dimensions of ∼1 mm can be studied in materials containing elements across much of the Periodic Table. This review describes hardware and software associated with HEDM as well as examples of applications. These applications include studies of grain growth, recrystallization, texture development, orientation gradients, deformation twinning, annealing twinning, plastic deformation, and additive manufacturing. We also describe relationships to other X-ray-based methods as well as prospects for further development.
Read the paper
Related studies
- Developing high safety Li-metal anodes for future high-energy Li-metal batteries: strategies and perspectives
- Structure and Energy Transfer in Photosystems of Oxygenic Photosynthesis
- Ground- and Space-Based Gamma-Ray Astronomy
- Energy Functions in De Novo Protein Design: Current Challenges and Future Prospects
- Electronic structure of ions and molecules in solution: a view from modern soft X-ray spectroscopies
- Arising 2D Perovskites for Ionizing Radiation Detection
Go deeper in Evidence Hub
Evidence Hub adds a study data sheet (design, sample size, evidence level, key numbers), an AI summary and a chat grounded in the paper's text.