An examination of automatic exposure control regimes for two digital radiography systems
Abstract
The influence of two methods of an automatic exposure control (AEC) setup using a simple measure of detectability is examined as a function of x-ray beam quality for a computed radiography (CR) system and for an indirect conversion digital radiography (DR) system. The regimes assessed were constant air kerma at the detector and the constant contrast noise ratio (CNR). A low scatter geometry was employed with x-ray spectra varying from 60 kV and 1 mm Cu to 125 kV and 2 mm Cu. The CNR was measured using a 2 mm thick Al square of dimension 1 cm by 1 cm. Detectability was quantified via a nominal contrast for a fixed beam quality of 70 kV and 1 mm added Cu filtration, taken from c-d curves measured using the Leeds TO20 test object, for the four x-ray spectra. In addition, objective image quality parameters including modulation transfer function (MTF), noise power spectrum (NPS) and detective quantum efficiency (DQE) were also measured for both systems at the four different x-ray spectra. It was found that the constant air kerma strategy did not maintain threshold nominal contrast (simple detectability) constant as the x-ray beam mean energy increased, for either the CR system or the DR system. For the CR detector, the threshold nominal contrast for a 1 mm disc increased by a factor of 4.4 from 3.50% to 15.4% as the tube potential was raised from 60 kV to 125 kV, while for the DR detector, the threshold nominal contrast increased by a factor of 3.4, from 2.27% to 7.67% as the…
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