Broadband high-resolution X-ray ptychography system spanning tender to hard X-ray regimes
Abstract
X-ray ptychography is a high-resolution imaging technique capable of resolving nanoscale structures and probing chemical states. However, despite advances, most conventional X-ray ptychography systems have been designed to operate within a single energy regime, such as hard (> 5 keV), soft (4·2H2O particles to demonstrate the spectromicroscopic capabilities of the system. The reconstructed images provide spatially resolved X-ray absorption spectra, revealing distinct edge features. This system not only enables element-specific imaging across the tender to hard X-ray spectrum but is also particularly advantageous for light-element materials, which benefit from enhanced phase contrast in the tender X-ray range. This advancement opens up new possibilities for in situ imaging of complex chemical environments in energy devices and biological specimens.
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