Estimation of X-ray scattering impact in imaging degradation for the SIMBOL-X telescope
Abstract
The imaging performance of X-ray optics (expressed in terms of HEW, Half-Energy-Width) can be severely affected by X-ray scattering caused by the surface roughness of the mirrors. The impact of X-ray scattering has an increasing relevance for increasing photon energy, and can be the dominant problem in a hard X-ray telescope like SIMBOL-X. In this work we show how, by means of a novel formalism, we can derive a surface roughness tolerance - in terms of its power spectrum - from a specific HEW requirement for the SIMBOL-X optical module.
Read the paper
Related studies
- The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules
- X-ray-Computed Tomography Contrast Agents
- Reactivity of Surface Species in Heterogeneous Catalysts Probed by In Situ X-ray Absorption Techniques
- Single-crystal X-ray diffraction studies on structural transformations of porous coordination polymers
- Investigation of solid/vapor interfaces using ambient pressure X-ray photoelectron spectroscopy
- Resonant X-Ray Scattering Studies of Charge Order in Cuprates
Go deeper in Evidence Hub
Evidence Hub adds a study data sheet (design, sample size, evidence level, key numbers), an AI summary and a chat grounded in the paper's text.