Blade-Coating: A Path to Commercializing Perovskite X-ray Flat-Panel Detectors
Abstract
Metal halide perovskites have emerged as promising candidates for next-generation X-ray flat-panel detectors (FPDs) due to their strong X-ray attenuation, high carrier mobility-lifetime product, and cost-effective fabrication. Among various deposition techniques, blade-coating stands out for its scalability, reproducibility, integration compatibility with thin-film transistor panels, and low cost. This perspective summarizes recent advances in blade-coating technology for perovskite polycrystalline thick film fabrication, focusing on precursor engineering, solvent optimization, and posttreatment for enhancing film quality, uniformity, integration, and device performance. Key performance metrics are discussed and evaluated against commercial standards. Future efforts in material engineering, device and interface design, and mild processing, bridging the gap between lab-scale breakthroughs and practical applications, are discussed.
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