Applications of X‐Ray‐Based Characterization in MXene Research
Abstract
X‐rays are a penetrating form of high‐energy electromagnetic radiation with wavelengths ranging from 10 pm to 10 nm. Similar to visible light, X‐rays provide a powerful tool to study the atoms and elemental information of objects. Different characterization methods based on X‐rays are established, such as X‐ray diffraction, small‐ and wide‐angle X‐ray scattering, and X‐ray‐based spectroscopies, to explore the structural and elemental information of varied materials including low‐dimensional nanomaterials. This review summarizes the recent progress of using X‐ray related characterization methods in MXenes, a new family of 2D nanomaterials. These methods provide key information on the nanomaterials, covering synthesis, elemental composition, and the assembly of MXene sheets and their composites. Additionally, new characterization methods are proposed as future research directions in the outlook section to enhance understanding of MXene surface and chemical properties. This review is expected to provide a guideline for characterization method selection and aid in precise interpretation of the experimental data in MXene research.
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