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Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

C. Vanhoof, A. Cross, U. Fittschen, L. Vincze

Journal of Analytical Atomic Spectrometry, 2022

96 citations

Abstract

This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

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